Journal article
Comparison of amorphous silicon absorber materials: Kinetics of light-induced degradation
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Stuckelberger, Michael
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Billet, Adrian
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Riesen, Yannick
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Boccard, Mathieu
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Despeisse, Matthieu
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Schüttauf, Jan-Willem
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Haug, Franz-Josef
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Ballif, Christophe
Ecole Polytechnique Fédérale de Lausanne (EPFL); Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory; Rue de la Maladière 71, CH-2000 Neuchâtel Switzerland
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Published in:
- Progress in Photovoltaics: Research and Applications. - Wiley. - 2014, vol. 24, no. 4, p. 446-457
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Language
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Open access status
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closed
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Identifiers
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Persistent URL
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https://sonar.rero.ch/global/documents/80068
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